Scanning probe-based local spectroscopy of semiconductor heterostructures below 300mK
Open access
Date
2002Type
- Doctoral Thesis
ETH Bibliography
yes
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Permanent link
https://doi.org/10.3929/ethz-a-004409593Publication status
publishedExternal links
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Publisher
s.n.Subject
HALBLEITERMATERIALIEN (ELEKTROTECHNIK); HETEROKONTAKT + HETEROSTRUKTUR (KRISTALLOGRAPHIE); RASTERSONDENMIKROSKOPE, RSM + RASTERSONDENMIKROSKOPIE; SEMICONDUCTOR MATERIALS (ELECTRICAL ENGINEERING); HETEROJUNCTION + HETEROSTRUCTURE (CRYSTALLOGRAPHY); SCANNING PROBE MICROSCOPES, SPM + SCANNING PROBE MICROSCOPYOrganisational unit
03439 - Ensslin, Klaus / Ensslin, Klaus
Notes
Diss., Naturwissenschaften ETH Zürich, Nr. 14705, 2002.More
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ETH Bibliography
yes
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